System Architecture
Solution Optimization
BOM Cost
Energy Storage
Custom Magnetics Design
Behavioral modeling and simulation
IC Definition, Design, and Layout
Analog
Amplifiers, comparators, voltage references, current references, regulators, oscillators, timers, non-linear functions (multipliers, dividers), gate drivers, controllers
High voltage (10V to 700V)
Low voltage (0.7V to 10V)
High power
Low power (microwatt)
Mixed-Signal
ADC, DAC, finite state machine definition, I2C and one-wire interfaces
Power Management
Portable power
Industrial power
Telecom/Datacom power
Technologies
Bipolar, CMOS, DMOS (BCDMOS) and JFET
Package Development
Custom leadframes
System-in-package
Modules
Stacked die
Flip chip on lead frame
Copper pillar
Product Qualification
Delamination check
Highly Accelerated Stress Test
High Temperature Operating Life Test
ESD test
Latchup Test
Failure Analysis / Debug
Wafer probe
Thermal testing
Focused Ion Beam (FIB) re-work
Emission Microscopy (EMMI)
Optical Beam Induced Resistance Change (OBIRCH)
Test Development
Product Characterization
Production Test